Simulation and hit reconstruction of irradiated pixel sensors for the CMS experiment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 566, Issue 1, 2006, Pages 40-44

  Alagoz E ^a,c   Chiochia, V ^a   Swartz, M ^b  

^a PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^b JOHNS HOPKINS UNIVERSITY   (United States)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Charge collection; CMS; Electric field; Pixel; Radiation hardness; Silicon

Indexed keywords

ALGORITHMS; CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC FIELDS; IRRADIATION; SILICON; TRACKING (POSITION);

CHARGE COLLECTION; CMS; PIXEL SENSORS; RADIATION HARDNESS;

IMAGE SENSORS;

EID: 33748546921     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.027     Document Type: Article

References (10)

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