CMS pixel simulations

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 511, Issue 1-2, 2003, Pages 88-91

  Swartz, M ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ELECTRIC FIELD EFFECTS; HALL EFFECT; SENSORS;

PIXEL SENSORS;

NUCLEAR INSTRUMENTATION;

EID: 0041386487     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01757-1     Document Type: Conference Paper

References (8)

1. M. Swartz, CMS Note 2002/027, July 2002. http://cmsdoc.cern.ch/doc/notes/docs/NOTE2002_027.
2. Bichsel H. Rev. Mod. Phys. 60:1988;663.
3. C.J.S. Damerell, Proceedings of the 1995 SLAC Summer Institute on Particle Physics, Stanford, CA, USA, 1996, p. 103.
4. R. Kaufmann, B. Henrich, Charge Drift in Silicon, CMS Pixel Internal Note, October, 1998. [http://cms.web.psi.ch/ipn/pix_in_1998_3.ps].
5. Silvaco International, ATLAS User's Manual v5.2.0, 2000.
6. G. Kramberger, V. Cindro, I. Mandic, M. Mikuz, M. Zavrtanik, ROSE/TN/2001-01; Nucl. Instr. and Meth. A 476 (2002) 645.
7. Ragusa F. Atlas Collaboration. Nucl. Instr. and Meth. A 447:2000;184.
8. L. Cremaldi, Nucl. Instr. and Meth. A, (2003) these Proceedings.