Parametric fault diagnosis for analog circuits using a Bayesian framework

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 272-277

  Liu, Fang ^a   Nikolov, Plamen K ^a   Ozev, Sule ^a  

^a USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIER CIRCUITS; BAYESIAN FRAMEWORK; DIAGNOSTIC RESOLUTION;

HIERARCHICAL SYSTEMS; MEASUREMENT THEORY; NETWORKS (CIRCUITS); ONLINE SYSTEMS; STATISTICAL METHODS;

ELECTRIC FAULT LOCATION;

EID: 33751101642     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.54     Document Type: Conference Paper

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