Automatic test generation for maximal diagnosis of linear analog circuits

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 254-258

  Mir, S ^a   Lubaszewski, M ^a   Kolarik, V ^a   Courtois, B ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS;

FAULT BASED MULTIFREQUENCY TEST; LINEAR ANALOG CIRCUITS; SIMULATE AFTER TEST FAULT DIAGNOSIS;

HYBRID INTEGRATED CIRCUITS;

EID: 0029734408     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)