The impacts of untestable defects on transition fault testing

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 2-7

  Xijiang, Lin ^a   Rajski, Janusz ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATPG PROCEDURES; STUCK-OPEN FAULTS; TRANSITION FAULT TEST SET;

COMPUTER SIMULATION; NONDESTRUCTIVE EXAMINATION; PHASE TRANSITIONS; STACKING FAULTS;

CRYSTAL DEFECTS;

EID: 33751074464     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.87     Document Type: Conference Paper

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