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Volumn 14, Issue 3, 1997, Pages 11-14
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The Future of Test and DFT
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER DEBUGGING;
COST EFFECTIVENESS;
DATA STORAGE EQUIPMENT;
ERROR CORRECTION;
INTEGRATED CIRCUIT TESTING;
LEAKAGE CURRENTS;
MICROPROCESSOR CHIPS;
PROBABILITY;
RISK ASSESSMENT;
TRANSISTORS;
DESIGN FOR TESTABILITY (DFT);
OVERALL TIMING ACCURACY (OTA);
INTEGRATED CIRCUIT LAYOUT;
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EID: 0031186626
PISSN: 07407475
EISSN: None
Source Type: Journal
DOI: 10.1109/54.605985 Document Type: Article |
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Times cited : (10)
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References (0)
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