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Volumn 27, Issue 2-3, 2007, Pages 1129-1135
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Structure-properties correlations for barium titanate thin films obtained by rf-sputtering
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Author keywords
BaTiO3; Dielectric properties; Films; Grain size; X ray methods
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Indexed keywords
BARIUM TITANATE THIN FILMS;
DEPOSITION-ANNEALING TECHNIQUE;
POLYCRYSTALLINE FILMS;
STRUCTURAL CHARACTERISTICS;
ANNEALING;
BARIUM TITANATE;
DIELECTRIC PROPERTIES;
GRAIN SIZE AND SHAPE;
MAGNETRON SPUTTERING;
POLYCRYSTALLINE MATERIALS;
SURFACE TOPOGRAPHY;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CERAMIC MATERIALS;
ANNEALING;
BARIUM TITANATE;
CERAMIC MATERIALS;
DIELECTRIC PROPERTIES;
GRAIN SIZE AND SHAPE;
MAGNETRON SPUTTERING;
POLYCRYSTALLINE MATERIALS;
SURFACE TOPOGRAPHY;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
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EID: 33751067779
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2006.05.043 Document Type: Article |
Times cited : (40)
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References (15)
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