Neural network-based defect detection in analog and mixed IC using digital signal preprocessing

Journal of Electrical Engineering

Volumn 57, Issue 5, 2006, Pages 249-257

  Stopjaková, Viera ^a   Malošek, Pavol ^b   Nagy, Vladislav ^a  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b Faculty of Electrical Engineering and Information Technology

Author keywords

Artificial neural networks; Convex hull algorithm; Defect detection; Principal component analysis; Testing analog IC; Wavelet decomposition

Indexed keywords

EID: 33751040554     PISSN: 13353632     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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