iDD Pulse Response Testing applied to complex CMOS ICs

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 32-38

  Beasley, J S ^a   Righter, A W ^a   Apodaca, C J ^a   Pour Mozafari, S ^a   Huggett, D ^a  

^a NEW MEXICO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER SUPPLIES TO APPARATUS;

PULSE RESPONSE TESTING; TRANSIENT POWER SUPPLY CURRENT ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0031342923     PISSN: 10893539     EISSN: None     Source Type: None    
DOI: 10.1109/TEST.1997.639591     Document Type: Conference Paper

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