Electron transport via local polarons at interface atoms

Physical Review Letters

Volumn 97, Issue 20, 2006, Pages

  Berthe, M ^a   Urbieta, A ^a   Perdigao L ^a   Grandidier, B ^a   Deresmes, D ^a   Delerue, C ^a   Stievenard D ^a   Rurali, R ^b   Lorente, N ^b   Magaud, L ^c   Ordejon P ^d  

^a INSTITUT D ELECTRONIQUE   (France)

^b CNRS   (France)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^d INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; INTERFACES (MATERIALS); MOLECULAR VIBRATIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING BORON; SEMICONDUCTING SILICON COMPOUNDS;

DANGLING BOND STATES; ELECTRON VIBRATION COUPLING;

ELECTRON TRANSPORT PROPERTIES;

EID: 33751022987     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.206801     Document Type: Article

References (32)

1. A. Nitzan and M.A. Ratner, Science 300, 1384 (2003). SCIEAS 0036-8075 10.1126/science.1081572
2. N. Agraït, A. Levy Yeyati, and J.M. van Ruitenbeek, Phys. Rep. 377, 81 (2003), and references therein. PRPLCM 0370-1573 10.1016/S0370-1573(02)00633- 6
3. J. Koch and F. von Oppen, Phys. Rev. Lett. 94, 206804 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.94.206804
4. J. Koch, M.E. Raikh, and F. von Oppen, Phys. Rev. Lett. 95, 056801 (2005); PRLTAO 0031-9007 10.1103/PhysRevLett.95.056801
5. J. Koch M.E. Raikh F. von Oppen Phys. Rev. Lett. PRLTAO 0031-9007 96, 056803 (2006). 10.1103/PhysRevLett.96.056803
6. P.S. Cornaglia, H. Ness, and D.R. Grempel, Phys. Rev. Lett. 93, 147201 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.93.147201
7. Jens Paaske and Karsten Flensberg, Phys. Rev. Lett. 94, 176801 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.94.176801
8. W. Koller, A.C. Hewson, and D.M. Edwards, Phys. Rev. Lett. 95, 256401 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.256401
9. H. Ness and A.J. Fisher, Phys. Rev. Lett. 83, 452 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.83.452
10. M.-L. Bocquet, H. Lesnard, and N. Lorente, Phys. Rev. Lett. 96, 096101 (2006). PRLTAO 0031-9007 10.1103/PhysRevLett.96.096101
11. M. Paulsson, T. Frederiksen, and M. Brandbyge, Nano Lett. NALEFD 1530-6984 6, 258 (2006); 10.1021/nl052224r
12. M. Paulsson T. Frederiksen M. Brandbyge Phys. Rev. B PRBMDO 0163-1829 72, 201101(R) (2005). 10.1103/PhysRevB.72.201101
13. T. Frederiksen, Phys. Rev. Lett. 93, 256601 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.93.256601
14. N. Agraït, Phys. Rev. Lett. 88, 216803 (2002). PRLTAO 0031-9007 10.1103/PhysRevLett.88.216803
15. S. Wu, Phys. Rev. Lett. 93, 236802 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.93.236802
16. J. Repp, Phys. Rev. Lett. 95, 225503 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.95.225503
17. I.-W. Lyo, E. Kaxiras, and Ph. Avouris, Phys. Rev. Lett. 63, 1261 (1989). PRLTAO 0031-9007 10.1103/PhysRevLett.63.1261
18. P. Ebert, Surf. Sci. Rep. 33, 121 (1999). SSREDI 0167-5729 10.1016/S0167-5729(98)00011-9
19. G. Mahieu, Phys. Rev. Lett. 94, 026407 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.94.026407
20. R.M. Feenstra, J.M. Woodall, and G.D. Pettit, Phys. Rev. Lett. 71, 1176 (1993). PRLTAO 0031-9007 10.1103/PhysRevLett.71.1176
21. T.M. Grehk, P. Mårtenson, and J.M. Nicholls, Phys. Rev. B PRBMDO 0163-1829 46, 2357 (1992); 10.1103/PhysRevB.46.2357
22. H.Q. Shi, M.W. Radny, and P.V. Smith, Phys. Rev. B PRBMDO 0163-1829 66, 085329 (2002). 10.1103/PhysRevB.66.085329
23. X. de la Broise, Phys. Rev. B PRBMDO 0163-1829 61, 2138 (2000). 10.1103/PhysRevB.61.2138
24. C. Delerue, G. Allan, and M. Lannoo, Phys. Rev. B PRBMDO 0163-1829 48, 11024 (1993). 10.1103/PhysRevB.48.11024
25. W.A. Harrison, Surf. Sci. 55, 1 (1976). SUSCAS 0039-6028 10.1016/0039-6028(76)90372-1
26. M. Lannoo and P. Friedel, Atomic and Electronic Structure of Surfaces (Springer Verlag, New York, 1991).
27. J. Soler, J. Phys. Condens. Matter 14, 2745 (2002); JCOMEL 0953-8984 10.1088/0953-8984/14/11/302
28. http://www.uam.es/siesta/.
29. G.D. Mahan, Many-particles Physics (Plenum, New York, 2000).
30. M. Lannoo and J. Bourgoin, Point Defects in Semiconductors (Springer Verlag, Berlin, 1983).
31. C. Delerue, G. Allan, and M. Lannoo, Phys. Rev. B PRBMDO 0163-1829 48, 11024 (1993). 10.1103/PhysRevB.48.11024
32. D. Goguenheim and M. Lannoo, J. Appl. Phys. 68, 1059 (1990). JAPIAU 0021-8979 10.1063/1.346745