Theory of scanning tunneling microscopy of defects on semiconductor surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 3, 2000, Pages 2138-2145

  de la Broise X ^a   Delerue, C ^a   Lannoo, M ^a   Grandidier, B ^a   Stievenard D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001074477     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.2138     Document Type: Article

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