An efficient random jitter measurement technique using fast comparator sampling

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2005, Pages 123-130

  Hong, Dongwoo ^a   Dryden, Cameron ^b   Saksena, Gordon ^c   Panis, Michael ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Metrologic Instruments ^*  (United States)

^c TERADYNE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED TEST EQUIPMENT; DATA EDGES; EDGE REGION; HIGH SPEED SERIAL INTERFACE; LOW-FREQUENCY; RANDOM JITTERS; SIMPLE ALGORITHM;

COMPARATORS (OPTICAL); CUTOFF FREQUENCY; INTEGRATED CIRCUIT TESTING;

JITTER;

EID: 33751010590     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2005.30     Document Type: Conference Paper

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