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Volumn , Issue , 2002, Pages 700-709

Jitter testing for multi-gigabit backplane serdes -techniques to decompose and combine various types of jitter

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; CURVE FITTING; JITTER; NUMERICAL METHODS; SIGNAL RECEIVERS; STATISTICAL METHODS; TRANSCEIVERS; TRANSPONDERS;

EID: 0036444502     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (35)

References (7)
  • 1
    • 85067535110 scopus 로고    scopus 로고
    • Supplement to carrier sense multiple access with collision detection (CSMA/CD) access method & physical layer specifications
    • IEEE Draft P802.3ae/D3.3; XGMII Extended Sublayer (XGXS) and 10 Gigabit Attachment Unit Interface (XAUI), October
    • IEEE Draft P802.3ae/D3.3, Supplement to Carrier Sense Multiple Access with Collision Detection (CSMA/CD) Access Method & Physical Layer Specifications, XGMII Extended Sublayer (XGXS) and 10 Gigabit Attachment Unit Interface (XAUI), October 2001.
    • (2001)
  • 2
    • 85067533264 scopus 로고    scopus 로고
    • T11.2/project 1316-DT/rev 3.1: Fiber channel methodologies for jitter and signal quality specification
    • National Committee for Information Technology Standardization (NCITS); October
    • National Committee for Information Technology Standardization (NCITS) T11.2/Project 1316-DT/Rev 3.1: Fiber Channel Methodologies for Jitter and Signal Quality Specification, October 2001.
    • (2001)
  • 5
    • 0038358422 scopus 로고    scopus 로고
    • Comparison and correlation of signal integrity measurement techniques
    • J. Patrin and M. Li, Comparison and Correlation of Signal Integrity Measurement Techniques, DesignCon, 2002.
    • (2002) DesignCon
    • Patrin, J.1    Li, M.2
  • 6
    • 0036142374 scopus 로고    scopus 로고
    • Jitter testing for gigabit serial communication transceivers
    • January
    • Y. Cai, B. Laquai, K. Luehman, Jitter Testing For Gigabit Serial Communication Transceivers, IEEE Design and Test of Computers, pp66-74, January 2002.
    • (2002) IEEE Design and Test of Computers , pp. 66-74
    • Cai, Y.1    Laquai, B.2    Luehman, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.