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Volumn , Issue , 2002, Pages 700-709
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Jitter testing for multi-gigabit backplane serdes -techniques to decompose and combine various types of jitter
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Author keywords
[No Author keywords available]
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Indexed keywords
BIT ERROR RATE;
CURVE FITTING;
JITTER;
NUMERICAL METHODS;
SIGNAL RECEIVERS;
STATISTICAL METHODS;
TRANSCEIVERS;
TRANSPONDERS;
JITTER TESTING;
MULTI-GIGABIT BACKPLANE DESERIALIZER;
PERIODIC JITTER;
RANDOM JITTER;
INTEGRATED CIRCUIT TESTING;
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EID: 0036444502
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (35)
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References (7)
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