Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 50, Issue 6, 2003, Pages 288-298

  Yamaguchi, Takahiro J ^a   Soma, Mani ^b   Ishida, Masahiro ^a   Watanabe, Toshifumi ^a   Ohmi, Tadahiro ^c  

^a ADVANTEST CORPORATION   (Japan)

^b University of Washington   (United States)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Analytic signal; Hilbert transform; Oscilloscope; Period jitter; Phase detector; Phase noise; PLL; Sinusoidal jitter; Timing interval analyzer; Timing jitter; VCO; Zero crossing detector

Indexed keywords

CATHODE RAY OSCILLOSCOPES; DIGITAL COMMUNICATION SYSTEMS; PHASE LOCKED LOOPS; SPURIOUS SIGNAL NOISE;

HILBERT TRANSFORM;

JITTER;

EID: 0038721321     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSII.2003.812916     Document Type: Article

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