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Volumn 27, Issue 2-3, 2007, Pages 1083-1086
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Optimization of processing parameters for preparation of LaNiO 3 thin films from the citrate precursors
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Author keywords
Films; Precursors organic
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
ELECTRIC CONDUCTORS;
ELECTRODES;
FERROELECTRIC THIN FILMS;
HEAT TREATMENT;
OPTIMIZATION;
PROCESSING;
X RAY DIFFRACTION ANALYSIS;
ELECTRICALLY CONDUCTIVE CERAMICS;
POLYMERIC CITRATE PRECURSORS;
CERAMIC MATERIALS;
ATOMIC FORCE MICROSCOPY;
CERAMIC MATERIALS;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
ELECTRIC CONDUCTORS;
ELECTRODES;
FERROELECTRIC THIN FILMS;
HEAT TREATMENT;
OPTIMIZATION;
PROCESSING;
X RAY DIFFRACTION ANALYSIS;
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EID: 33751006974
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2006.05.021 Document Type: Article |
Times cited : (9)
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References (18)
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