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Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 94, Issue 2-3, 2002, Pages 229-236

Crystallization kinetics and dielectric properties of solution deposited, La doped PZT thin films

(4) Es Souni, M a Abed, M a Solterbeck, C H a Piorra, A a

a UNIVERSITY OF APPLIED SCIENCES (Germany)

Author keywords

Electric properties; Ferroelectric thin films; Lead zirconate titanate; Metallorganic deposition; Microstructure; Refraction index

Indexed keywords

ANNEALING; CRYSTALLIZATION; DEPOSITION; DIELECTRIC PROPERTIES; FERROELECTRICITY; LANTHANUM; NANOSTRUCTURED MATERIALS; ORGANOMETALLICS; PEROVSKITE; POSITIVE IONS; REACTION KINETICS; REFRACTIVE INDEX; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DOPING; STOICHIOMETRY; TEXTURES;

CHEMICAL SOLUTION DEPOSITION (CSD);

FERROELECTRIC THIN FILMS;

EID: 0036606436 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(02)00099-5 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.