Drying temperature effects on microstructure, electrical properties and electro-optic coefficients of sol-gel derived PZT thin films

Thin Solid Films

Volumn 340, Issue 1, 1999, Pages 242-249

  Lee, Changho ^a   Spirin, Vasili ^a   Song, Hanwook ^a   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DRYING; ELECTRIC VARIABLES MEASUREMENT; ELECTROOPTICAL EFFECTS; FERROELECTRICITY; INTERFEROMETERS; LIGHT POLARIZATION; MICROSTRUCTURE; PERMITTIVITY; PEROVSKITE; SEMICONDUCTING LEAD COMPOUNDS; SOL-GELS; THERMAL EFFECTS;

ELECTROOPTIC COEFFICIENTS; LEAD ZIRCONIUM TITANATE; TWO BEAM POLARIZATION INTERFEROMETER;

THIN FILMS;

EID: 0032647837     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01412-6     Document Type: Article

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