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Volumn 253, Issue 3, 2006, Pages 1304-1309
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The importance of the series resistance in calculating the characteristic parameters of the Schottky contacts
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Author keywords
Ideality factor; Interface states distribution; Schottky barrier height; Series resistance
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Indexed keywords
CADMIUM COMPOUNDS;
CURRENT VOLTAGE CHARACTERISTICS;
DENSITY (SPECIFIC GRAVITY);
ELECTRIC RESISTANCE;
OXIDES;
STATISTICAL METHODS;
IDEALITY FACTOR;
INTERFACE STATE DENSITY DISTRIBUTION (ISDD);
SCHOTTKY BARRIER HEIGHT;
SERIES RESISTANCE;
SCHOTTKY BARRIER DIODES;
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EID: 33750720923
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.02.001 Document Type: Article |
Times cited : (19)
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References (26)
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