-
1
-
-
0030082199
-
Far ultraviolet absolute reflectometer for optical constants determination of ultra high vacuum prepared thin films
-
J.A. Aznàrez, J. I. Larruquert, J. A. Méndez, "Far ultraviolet absolute reflectometer for optical constants determination of ultra high vacuum prepared thin films", Rev. Sci. Instr. 67, 497-502 (1996).
-
(1996)
Rev. Sci. Instr.
, vol.67
, pp. 497-502
-
-
Aznàrez, J.A.1
Larruquert, J.I.2
Méndez, J.A.3
-
2
-
-
30844449955
-
Reflecting coatings for the extreme ultraviolet
-
G. Hass, R. Tousey, "Reflecting coatings for the extreme ultraviolet", JOSA 49, 593-602 (1959).
-
(1959)
JOSA
, vol.49
, pp. 593-602
-
-
Hass, G.1
Tousey, R.2
-
4
-
-
0036460178
-
2 films deposited by ion-beam sputtering and their application as protective coatings for Al
-
2 films deposited by ion-beam sputtering and their application as protective coatings for Al, Opt. Commun. 215, 93-99 (2003).
-
(2003)
Opt. Commun.
, vol.215
, pp. 93-99
-
-
Larruquert, J.I.1
Keski-Kuha, R.A.M.2
-
5
-
-
84975582175
-
Interference filters for the far ultraviolet
-
A. Malherbe, "Interference filters for the far ultraviolet", Appl. Opt. 13, 1275-1276 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 1275-1276
-
-
Malherbe, A.1
-
6
-
-
84964931621
-
Interference filters for the VUV (1200-1900 Å)
-
E. T. Fairchild, "Interference filters for the VUV (1200-1900 Å)", Appl. Opt. 12, 2240-2241 (1973).
-
(1973)
Appl. Opt.
, vol.12
, pp. 2240-2241
-
-
Fairchild, E.T.1
-
7
-
-
0041379882
-
Optical properties of Yb films in the far and the extreme ultraviolet
-
J. I. Larruquert, J. A. Aznárez, J. A. Méndez, José Calvo-Angós, "Optical properties of Yb films in the far and the extreme ultraviolet", Appl. Opt. 42, 4566-4572 (2003).
-
(2003)
Appl. Opt.
, vol.42
, pp. 4566-4572
-
-
Larruquert, J.I.1
Aznárez, J.A.2
Méndez, J.A.3
Calvo-Angós, J.4
-
8
-
-
0010262495
-
Silicon-carbide diffraction grating for the vacuum ultraviolet: Feasibility
-
W. J. Choyke, W. D. Partlow, E. P. Supertzi, F. J. Venskytis, G. B. Brandt, "Silicon-carbide diffraction grating for the vacuum ultraviolet: feasibility," Appl. Opt. 16, 2013-2014 (1977).
-
(1977)
Appl. Opt.
, vol.16
, pp. 2013-2014
-
-
Choyke, W.J.1
Partlow, W.D.2
Supertzi, E.P.3
Venskytis, F.J.4
Brandt, G.B.5
-
9
-
-
84975556409
-
Normal incidence reflectance of ion beam deposited SiC films in the EUV
-
R. A. M. Keski-Kuha, J. F. Osantowski, H. Herzig, J. S. Gum, and A. R. Toft, "Normal incidence reflectance of ion beam deposited SiC films in the EUV," Appl. Opt. 27, 2815-2816 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 2815-2816
-
-
Keski-Kuha, R.A.M.1
Osantowski, J.F.2
Herzig, H.3
Gum, J.S.4
Toft, A.R.5
-
10
-
-
0028508153
-
Ion-beam deposited boron carbide coatings for the extreme ultraviolet
-
G. M. Blumenstock and R. A. M. Keski-Kuha, "Ion-beam deposited boron carbide coatings for the extreme ultraviolet," Appl. Opt. 33, 5962-5963 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 5962-5963
-
-
Blumenstock, G.M.1
Keski-Kuha, R.A.M.2
-
12
-
-
0001420720
-
Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 121.6 nm
-
J. I. Larruquert, R. A. M. Keski-Kuha, "Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 121.6 nm", Appl. Opt. 38, 1231-1236 (1999).
-
(1999)
Appl. Opt.
, vol.38
, pp. 1231-1236
-
-
Larruquert, J.I.1
Keski-Kuha, R.A.M.2
-
13
-
-
0029517023
-
Degradation in EUV reflectance of ion-sputtered SiC films
-
Beam-Solid Interactions for Materials Synthesis and Characterization, D. C. Jacobson, D. E. Luzzi, T. F. Heinz, and M. Iwaki, eds.
-
D. Schwarcz, R. A. M. Keski-Kuha, "Degradation in EUV reflectance of ion-sputtered SiC films," in Beam-Solid Interactions for Materials Synthesis and Characterization, D. C. Jacobson, D. E. Luzzi, T. F. Heinz, and M. Iwaki, eds., Mater. Res. Soc. Symp. Proc. 354, 535-540 (1995).
-
(1995)
Mater. Res. Soc. Symp. Proc.
, vol.354
, pp. 535-540
-
-
Schwarcz, D.1
Keski-Kuha, R.A.M.2
-
14
-
-
33750603837
-
-
this volume
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J. I. Larruquert, M. Fernández-Perea, J. A. Aznárez, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone "Determination of the transmittance and extinction coefficient of Yb films in the 23-1,700-eV range", in this volume.
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Determination of the Transmittance and Extinction Coefficient of Yb Films in the 23-1,700-eV Rangen
-
-
Larruquert, J.I.1
Fernández-Perea, M.2
Aznárez, J.A.3
Méndez, J.A.4
Poletto, L.5
Garoli, D.6
Malvezzi, A.M.7
Giglia, A.8
Nannarone, S.9
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15
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33750603203
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this volume
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J. I. Larruquert, M. Fernández-Perea, J. A. Aznárez, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone ''Transmittance and extinction coefficient of Ce films measured in situ in the extreme ultraviolet and soft x-rays", in this volume.
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Transmittance and Extinction Coefficient of Ce Films Measured in Situ in the Extreme Ultraviolet and Soft X-rays
-
-
Larruquert, J.I.1
Fernández-Perea, M.2
Aznárez, J.A.3
Méndez, J.A.4
Poletto, L.5
Garoli, D.6
Malvezzi, A.M.7
Giglia, A.8
Nannarone, S.9
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