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Volumn 42, Issue 22, 2003, Pages 4566-4572

Optical properties of ytterbium films in the far and the extreme ultraviolet

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT TRANSMISSION; OPTICAL FILTERS; SPECTRUM ANALYSIS; ULTRAVIOLET RADIATION; YTTERBIUM;

EID: 0041379882     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.004566     Document Type: Article
Times cited : (25)

References (13)
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  • 2
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    • Absorption coefficients of rare-earth elements of the lanthanum group in the ultrasoft x-ray region
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  • 3
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    • X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50-30000 eV, Z = 1-92
    • B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30000 eV, Z = 1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
    • (1993) At. Data Nucl. Data Tables , vol.54 , pp. 181-342
    • Henke, B.L.1    Gullikson, E.M.2    Davis, J.C.3
  • 4
    • 85010134937 scopus 로고    scopus 로고
    • http://www-cxro.lbl.gov/optical_constants/.
  • 5
    • 0030082199 scopus 로고    scopus 로고
    • Far-ultraviolet absolute reflectometer for optical constant determination of ultrahigh vacuum prepared thin films
    • J. A. Aznarez, J. I. Larruquert, and J. A. Mendez, “Far-ultraviolet absolute reflectometer for optical constant determination of ultrahigh vacuum prepared thin films,” Rev. Sci. Instrum. 67, 497-502 (1996).
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    • Aznarez, J.A.1    Larruquert, J.I.2    Mendez, J.A.3
  • 6
    • 0034468958 scopus 로고    scopus 로고
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    • S. Fineschi, C. M. Korendyke, O. H. Siegmund, and B. E. Woodgate, eds., Proc. SPIE
    • J. I. Larruquert, J. A. Aznarez, and A. Mendez, “FUV reflec-tometer for in situ characterization of thin films deposited under UHV,” in Instrumentation for UV/EUV Astronomy and Solar Missions, S. Fineschi, C. M. Korendyke, O. H. Siegmund, and B. E. Woodgate, eds., Proc. SPIE 4139, 92-101 (2000).
    • (2000) Instrumentation for UV/EUV Astronomy and Solar Missions , vol.4139 , pp. 92-101
    • Larruquert, J.I.1    Aznarez, J.A.2    Mendez, A.3
  • 8
    • 0005157517 scopus 로고
    • of Practical Methods in Electron Microscopy, A. M. Glauert, ed. (North-Holland, Amsterdam,)
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  • 9
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    • Hunter, W.R.1    Angel, D.W.2    Tousey, R.3
  • 12
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    • Analysis of the electron excitation spectra in heavy rare earth metals, hydrides and oxides
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.