Sessile-drop-induced bending of atomic force microscope cantilevers: A model system for monitoring microdrop evaporation

Journal of Micromechanics and Microengineering

Volumn 16, Issue 11, 2006, Pages 2273-2280

  Haschke, Thomas ^a   Bonaccurso, Elmar ^b   Butt, Hans Jürgen ^b   Lautenschlager, Daniel ^a   Schönfeld, Friedhelm ^c   Wiechert, Wolfgang ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^c INSTITUT FÜR MIKROTECHNIK MAINZ GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DROP FORMATION; EVAPORATION; FINITE ELEMENT METHOD; KINETIC THEORY; SURFACE TENSION;

EVAPORATION KINETICS; LAPLACE PRESSURE; SOLID SURFACES; VAPOR PRESSURES;

CANTILEVER BEAMS;

EID: 33750587586     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/16/11/004     Document Type: Article

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