Effect of chain length of self-assembled monolayers on adhesion force measurement by AFM

Journal of Adhesion Science and Technology

Volumn 20, Issue 12, 2006, Pages 1281-1293

  Guo, L I Y A ^a   Zhao, Y A P U ^a  

^a INSTITUTE OF MECHANICS   (China)

Author keywords

Adhesion; Chain length; Lennard jones potential; Pull off point; Quasi continuum model; SAMs; Van der waals force

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CORRELATION THEORY; FORCE MEASUREMENT; SELF ASSEMBLY; VAN DER WAALS FORCES; CHAIN LENGTH; CONTINUUM MECHANICS; SELF ASSEMBLED MONOLAYERS;

CHAIN LENGTH; LENNARD-JONES POTENTIAL; PULL-OFF POINTS; QUASI-CONTINUUM MODELS;

MONOLAYERS; ADHESION;

ADHESION FORCE MEASUREMENTS; ADHESION FORCES; AFM; AFM TIP; ATOMIC FORCE MICROSCOPES; LENNARD-JONES POTENTIAL; PULL-OFF; SAMS; THEORETICAL MODELS; THEORETICAL RESULT; VAN DER WAALS;

EID: 33750569612     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/156856106778456555     Document Type: Article

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