Optical measurement of thermal contact conductance between wafer-like thin solid samples

Journal of Heat Transfer

Volumn 121, Issue 4, 1999, Pages 954-963

  Ohsone, Y ^a,d   Wu, G ^a   Dryden, J ^b   Zok, F ^c   Majumdar, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

^c University of California   (United States)

^d HITACHI LTD   (Japan)

Author keywords

Contact resistance; Experimental; Heat transfer; Measurement techniques; Thermophysical

Indexed keywords

FILM; OPTICAL TECHNIQUE; THERMAL CONDUCTIVITY;

EID: 0033379189     PISSN: 00221481     EISSN: 15288943     Source Type: Journal    
DOI: 10.1115/1.2826086     Document Type: Article

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