Generalized ellipsometry in unusual configurations

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 47-51

  Jellison Jr , G E ^a   Holcomb, D E ^a   Hunn, J D ^a   Rouleau, C M ^a   Wright, G W ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Birefringence; Ellipsometry; Optical anisotropy; Pockels effect

Indexed keywords

ANISOTROPY; BIREFRINGENCE; LIGHT POLARIZATION; OPTICAL MICROSCOPY; THIN FILMS;

BIREFRINGENCE MEASUREMENTS; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); OPTICAL ANISOTROPY; POCKELS EFFECT;

ELLIPSOMETRY;

EID: 33750522034     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.120     Document Type: Article

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