Alloying process of sputter-deposited Ti/Ni multilayer thin films

Materials Science and Engineering: A

Volumn 438-440, Issue SPEC. ISS., 2006, Pages 699-702

  Cho, H ^a   Kim, H Y ^a   Miyazaki, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Multilayer; Ni Ti; Shape memory alloy; Shape memory effect; Sputtering thin film; Ti Ni

Indexed keywords

ALLOYING; DIFFERENTIAL SCANNING CALORIMETRY; PROBES; SHAPE MEMORY EFFECT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ALLOYING PROCESS; ELECTRON PROBE MICRO ANALYSIS (EPMA); MULTILAYER THIN FILMS; SPUTTERING THIN FILM;

TITANIUM ALLOYS;

ALLOYING; DIFFERENTIAL SCANNING CALORIMETRY; PROBES; SHAPE MEMORY EFFECT; THIN FILMS; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33750442210     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.02.083     Document Type: Article

References (24)

1. Kohl M., Skrobanek K.D., and Miyazaki S. Sens. Actuators A 72 (1999) 243-250
2. Miyazaki S., Hirano M., and No V.H. Mater. Sci. Form 349-395 (2002) 467-474
3. Miyazaki S., and Ishida A. Mater. Sci. Eng. A 273-275 (1999) 106-133
4. Ishida A., Takei A., and Miyazaki S. Thin Solid Films 228 (1993) 210
5. Miyazaki S., Hashinaga T., and Yumikura K. Smart Mater. SPIE 2442 (1995) 156
6. Ishida A., Sato M., Takei A., Nomura K., and Miyazaki S. Metall. Mater. Trans. A 27 (1996) 3753
7. Miyazaki S., Hashinaga T., and Ishida A. Thin Solid Films 281-282 (1996) 364
8. Gyobu A., Kawamura Y., Horikawa H., and Saburi T. Mater. Trans. Japan Inst. Metals 37 (1996) 697
9. Quandt E., Halene C., Holleck H., Feit K., Kohl M., Schloβmacher P., Skokan A., and Skrobanck K.D. Sens. Actuators A 53 (1996) 434-439
10. Sawaguchi T., Sato M., and Ishida A. Mat. Sci. Eng. A 332 (2002) 47-55
11. Sanjabi S., Sadrnezhaad S.K., Yates K.A., and Barber Z.H. Thin Solid Films 491 (2005) 190-196
12. Lehnert T., Tixier S., Böni P., and Gotthardt R. Mat. Sci. Eng. A 273-275 (1999) 713-716
13. Lehnert T., Grimmer H., Böni P., Horisberger M., and Gotthardt R. Acta Mater. 48 (2000) 4065-4071
14. Meng W.J., Fultz B., Ma E., and Johnson L. Appl. Phys. Lett. 51 (1987) 661-663
15. Jankowski A.F., and Wall M.A. Thin Solid Films 181 (1989) 305-312
16. Hollanders M.A., Thijsse B.J., and Mittemeijer E.J. Phys. Rev. B42 (1990) 5481-5494
17. Sella C., Massza M., Kaabouchi M., El Monkade S., Miloche M., and Lassri H. J. Magn. Magn. Mater. 121 (1993) 201-204
18. Jankowski A.F. Thin Solid Films 220 (1992) 166-171
19. Jankowski A.F., and Wall M.A. J. Mater. Res. 9 (1994) 31-38
20. Jankowski A.F., and Wall M.A. NanoStruct. Mater. 7 (1996) 89-94
21. Benedictus R., Han K., Traeholt C., Bottger A., and Mittemeijer E.J. Acta Mater. 46 (1998) 5491-5508
22. Clemens B., and Sinclair R. MRS Bull. (1990) 19
23. Clemens B. Phys. Rev. B 33 (1986) 7615
24. Clemens B. J. Appl. Phys. 61 (1987) 4525