Structural characterization of sputter-deposited Ba0.48Sr0.52TiO3/LaNiO3 artificial superlattice structure by X-ray reflectivity and diffraction

Thin Solid Films

Volumn 515, Issue 3, 2006, Pages 1102-1106

  Lee, Hsin Yi ^a   Wu, Kun Fu ^b   Liu, Heng Jui ^a   Lee, Chih Hao ^b   Liang, Yuan Chang ^c  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c CHIENKUO TECHNOLOGY UNIVERSITY   (Taiwan)

Author keywords

Ferroelectric superlattice; RF sputtering; X ray reflectivity

Indexed keywords

BAND STRUCTURE; DIFFRACTION; DOPING (ADDITIVES); LIGHT REFLECTION; PERMITTIVITY; SINGLE CRYSTALS; SPUTTER DEPOSITION; X RAY ANALYSIS;

FERROELECTRIC SUPERLATTICES; RADIO FREQUENCY SPUTTERING; SUPERLATTICE STRUCTURES; X-RAY REFLECTIVITY;

BARIUM COMPOUNDS;

EID: 33750428958     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.07.043     Document Type: Article

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