Color counting and its application to path delay fault coverage

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2001-January, Issue , 2001, Pages 378-383

  Deodhar, Jayant ^a   Tragoudas, Spyros ^b  

^a INTEL CORPORATION   (United States)

^b SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT LINE; FAULT COVERAGES; FAULT MODEL; ITS APPLICATIONS; ON DEMANDS; PATH DELAY FAULT; SAMPLE SPACE;

COLOR;

EID: 33750361982     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2001.915259     Document Type: Conference Paper

References (11)

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