Accurate path delay fault coverage is feasible

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 201-210

  Tragoudas, S ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; C (PROGRAMMING LANGUAGE); COMBINATORIAL CIRCUITS; HEURISTIC METHODS; POLYNOMIALS; THEOREM PROVING;

PATH DELAY FAULTS; POLYNOMIAL TIME ALGORITHMS;

INTEGRATED CIRCUIT TESTING;

EID: 0033317483     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)