Status of small d-spacing X-ray multilayer development at Osmic

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4782, Issue , 2002, Pages 152-159

  Platonov, Yuriy ^a   Gomez, Luis ^a   Broadway, David ^a  

^a Osmic Inc   (United States)

Author keywords

Crystal; Fluorescence; Multilayer structure; Normal incidence; Optic; Spectroscopy; X ray

Indexed keywords

FLUORESCENCE; LIGHT REFLECTION; OPTICAL MULTILAYERS; PHOTONS; X RAY SPECTROSCOPY;

NORMAL INCIDENCE;

X RAY OPTICS;

EID: 0038302688     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451345     Document Type: Conference Paper

References (3)

1. See website: www.osmic.com
2. G. Gutman, High-performance Mo/Si and W/B4C multilayer mirrors for soft X-ray imaging optics, J.X-Ray Science and Technology, vol.4, No2, p 142, 1994.
3. R.W.James, The optical Principles of the Diffraction of X-Ray, in the Crystalline State, vol. II, Editor: L. Bragg, London, 1958.