Stroboscopic white-light interference microscopy

Applied Optics

Volumn 45, Issue 23, 2006, Pages 5840-5844

  De Groot, Peter ^a  

^a ZYGO CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; ERROR ANALYSIS; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT SOURCES; MONOCHROMATORS;

FRINGE CONTRAST LOSS; STROBOSCOPIC INTERFEROMETRY; STROBOSCOPIC WHITE-LIGHT INTERFERENCE MICROSCOPY;

OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; LIGHT; METHODOLOGY; OSCILLOMETRY; PHASE CONTRAST MICROSCOPY; STROBOSCOPY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHT; MICROSCOPY, INTERFERENCE; OSCILLOMETRY; STROBOSCOPY;

EID: 33749861586     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.005840     Document Type: Article

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