Study on the dielectric function of the CdMgTe alloy by using vacuum ultraviolet spectroscopic ellipsometry

Journal of the Korean Physical Society

Volumn 49, Issue 3, 2006, Pages 1156-1159

  Kim, T J ^a   Kim, Y D ^a   Kossut, J ^b  

^a Kyung Hee University   (South Korea)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

CdMgTe; Dielectric function; Ellipsometry

Indexed keywords

EID: 33749839269     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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