Parametric modeling of the dielectric functions of Cd1-xMg xTe alloy films

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 222-227

  Ihn, Y S ^a   Kim, T J ^a   Ghong, T H ^a   Kim, Y D ^a   Aspnes, D E ^b   Kossut, J ^c  

^a Kyung Hee University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

Cd1 xMgxTe; Chemical etching; Dielectric functions

Indexed keywords

DIELECTRIC PROPERTIES; ETCHING; MATHEMATICAL MODELS; OPTICAL PROPERTIES; PARAMETER ESTIMATION; POLYNOMIALS; SEMICONDUCTOR MATERIALS; THIN FILMS;

CD1-XMGXTE; CHEMICAL ETCHING; DIELECTRIC FUNCTIONS;

CADMIUM ALLOYS;

EID: 17144461545     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.015     Document Type: Conference Paper

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