Ellipsometric analysis on interface effects in CdMgTe and AlGaAs multilayer systems

Journal of the Korean Physical Society

Volumn 46, Issue SUPPL. II, 2005, Pages

  Kim, T J ^a   Ghong, T H ^a   Ihn, Y S ^a   Kim, Y D ^a  

^a Kyung Hee University   (South Korea)

Author keywords

AlGaAs; Bruggeman effective medium approximation; CdMgTe

Indexed keywords

EID: 22544447098     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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