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Applied Physics Letters

Volumn 71, Issue 2, 1997, Pages 249-251

Ellipsometric studies of Cd1-xMgxTe (0≤x≤0.5) alloys

(6) Choi, S G a Kim, Y D a Yoo, S D b Aspnes, D E b Miotkowski, I c Ramdas, A K c

a Kyung Hee University (South Korea)

b NORTH CAROLINA STATE UNIVERSITY (United States)

c PURDUE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000485910 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.119511 Document Type: Article

Times cited : (26)

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