Optical properties of Cd 1-xMg xTe (x=0.00, 0.23, 0.31, and 0.43) alloy films

Applied Physics Letters

Volumn 84, Issue 5, 2004, Pages 693-695

  Ihn, Y S ^a   Kim, T J ^a   Kim, Y D ^a   Aspnes, D E ^b   Kossut, J ^c  

^a Kyung Hee University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; SPECTROSCOPIC ELLIPSOMETRY (SE); THRESHOLD ENERGIES;

ELLIPSOMETRY; ETCHING; HIGH ENERGY ELECTRON DIFFRACTION; OPTOELECTRONIC DEVICES; OSCILLATIONS; SEMICONDUCTOR DEVICE MODELS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

CADMIUM ALLOYS;

EID: 1342304986     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1639506     Document Type: Article

References (12)

1. A. Waag, H. Heinke, S. Scholl, C. R. Becker, and G. Landwehr, J. Cryst. Growth 131, 607 (1993).
2. H. Arwin and D. E. Aspnes, J. Vac. Sci. Technol. A 2, 1316 (1984).
3. S. Adachi, T. Kimura, and N. Suzuki, J. Appl. Phys. 74, 3435 (1993).
4. P. Lautenschlager, S. Logothetidis, L. Vina, and M. Cardona, Phys. Rev. B 32, 3811 (1985).
5. M. Luttmann, F. Bertin, and A. Chabil, J. Appl. Phys. 78, 3387 (1995).
6. S. G. Choi, Y. D. Kim, S. D. Yoo, D. E. Aspnes, I. Miotkowski, and A. K. Ramdas, Appl. Phys. Lett. 71, 249 (1997).
7. Y. D. Kim, S. G. Choi, M. V. Klein, S. D. Yoo, D. E. Aspnes, S. H. Xin, and J. K. Furdyna, Appl. Phys. Lett. 70, 610 (1997).
8. B. Jobs, C. M. Herzinger, J. H. Dinan, A. Cornfeld, and J. D. Benson, Thin Solid Films 313, 137 (1998).
9. Y. S. Ihn, T. J. Kim, Y. D. Kim, D. E. Aspnes, and J. Kossut, J. Korean Phys. Soc. 43, 634 (2003).
10. D. E. Aspnes and A. A. Studna, Appl. Opt. 14, 220 (1975).
11. Y. D. Kim, S. L. Cooper, M. V. Klein, and B. T. Jonker, Appl. Phys. Lett. 62, 2387 (1993).
12. D. E. Aspnes and A. A. Studna, Appl. Phys. Lett. 39, 316 (1981).