Analysis and measurement of signal distortion due to ESD protection circuits

IEEE Journal of Solid-State Circuits

Volumn 41, Issue 10, 2006, Pages 2354-2357

  Chun, Jung Hoon ^a,b,c   Murmann, Boris ^a,b  

^a IEEE   (United States)

^b Stanford University   (United States)

^c RAMBUS INC   (United States)

Author keywords

CMOS analog integrated circuits; Electric distortion; Electrostatic discharge

Indexed keywords

CMOS ANALOG INTEGRATED CIRCUITS; ELECTROSTATIC DISCHARGE (ESD); ELECTROSTATIC DISCHARGE PROTECTION CIRCUITS; NONLINEAR CAPACITANCE;

ANALOG TO DIGITAL CONVERSION; CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC DISTORTION; POWER SUPPLY CIRCUITS; SIGNAL DISTORTION;

ELECTRIC DISCHARGES;

EID: 33749530251     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2006.881550     Document Type: Conference Paper

References (13)

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