Effect of surface treatment on leakage current of GaAs/AlGaAs laser microcavities

Applied Physics Letters

Volumn 82, Issue 25, 2003, Pages 4504-4506

  Kim, Jun Youn ^a   Lee, Jawoong ^a   Kim, Jungyeon ^a   Kang, Bongkoo ^a   Kwon, O'Dae ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

LASER APPLICATIONS; LEAKAGE CURRENTS; SEMICONDUCTING ALUMINUM COMPOUNDS; SURFACE TREATMENT;

LASER MICROCAVITIES;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0038044800     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1584784     Document Type: Article

References (12)

1. J. C. Ahn, K. S. Kwak, B. H. Park, H. Y. Kang, J.-Y. Kim, and O'D. Kwon, Phys. Rev. Lett. 82, 536 (1999); B. H. Park, J. C. Ahn, J. Bae, J. Y. Kim, S. D. Baek, and O. Kwon, Appl. Phys. Lett. 79, 1593 (2001).
2. J. C. Ahn, K. S. Kwak, B. H. Park, H. Y. Kang, J.-Y. Kim, and O'D. Kwon, Phys. Rev. Lett. 82, 536 (1999); B. H. Park, J. C. Ahn, J. Bae, J. Y. Kim, S. D. Baek, and O. Kwon, Appl. Phys. Lett. 79, 1593 (2001).
3. J.-Y. Kim, K. S. Kwak, J. S. Kim, B. K. Kang, and O'D. Kwon, J. Vac. Sci. Technol. B 19, 1334 (2001).
4. B. H. Park, J. Bae, M. J. Kim, and O'D. Kwon, Appl. Phys. Lett. 81, 580 (2002); O. Kwon, B. H. Park, J.-Y. Kim, and J. Bae, Physics/0204053.
5. B. H. Park, J. Bae, M. J. Kim, and O'D. Kwon, Appl. Phys. Lett. 81, 580 (2002); O. Kwon, B. H. Park, J.-Y. Kim, and J. Bae, Physics/0204053.
6. E. S. Aydil, Z. H. Zhou, R. A. Gottscho, and Y. J. Chabal, J. Vac. Sci. Technol. B 13, 258 (1995).
7. C. J. Sandroff, M. S. Hegde, L. A. Farrow, R. Bhat, J. P. Harbison, and C. C. Chang, J. Appl. Phys. 67, 586 (1990).
8. J.-F. Fan, H. Oigawa, and Y. Nannichi, Jpn. J. Appl. Phys. 27, L2125 (1988).
9. B. Corbett and W. M. Kelly, Appl. Phys. Lett. 62, 87 (1993).
10. J.-Y. Kim, S.-J. An, J. Kim, J. Lee, B. K. Kang, and O'D. Kwon (unpublished).
11. E. Yablonovitch, T. J. Gmitter, and B. G. Bagley, Appl. Phys. Lett. 57, 2241 (1990).
12. T. Ohno, Phys. Rev. B 44, 6306 (1991).