Multifrequency grating projection profilometry based on the nonlinear excess fraction method

Applied Optics

Volumn 38, Issue 19, 1999, Pages 4106-4110

  Hao, Yudong ^a   Zhao, Yang ^a   Li, Dacheng ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000484244     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004106     Document Type: Article

References (11)

1. V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phasemeasuring profilometry: a phase mapping approach,” Appl. Opt. 24, 185-188 (1985).
2. M. Takeda and K. Mutoh, “Fourier transform profilometry for the automatic measurement of 3-D object shapes,” Appl. Opt. 22, 3977-3982 (1983).
3. K. Creath and J. Schmit, “W-point spatial phase-measurement techniques for non-destructive testing,” Opt. Lasers Eng. 24, 365-379 (1996).
4. T. R. Judge and P. J. Bryanston-Cross, “A review of phase unwrapping techniques in fringe analysis,” Opt. Lasers Eng. 21, 199-239 (1994).
5. H. O. Saldner and J. M. Huntley, “Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector,” Opt. Eng. 36, 610-615 (1997).
6. J. M. Huntley and H. O. Saldner, “Error reduction methods for shape measurement by temporal phase unwrapping,” J. Opt. Soc. Am. A 14, 3188-3196 (1997).
7. W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260 (1995).
8. G. Sansoni, L. Biancardi, and U. Minoni, and F. Docchio, “A novel, adaptive system for 3-D optical profilometry using a liquid crystal light projector,” IEEE Trans. Instrum. Meas. 43, 558-565 (1994).
9. J.-L. Li, H.-J. Su, and X.-Y. Su, “Two-frequency grating used in phase-measuring profilometry,” Appl. Opt. 36, 277-280 (1997).
10. H. Zhao, W. Chen, and Y. Tan, “Phase-unwrapping algorithm for the measurement of three-dimensional object shapes,” Appl. Opt. 33, 4497-4500 (1994).
11. P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calcula tion algorithm,” Appl. Opt. 26, 2504-2506 (1987).