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Volumn 36, Issue 5, 2006, Pages 1128-1138

A vertical-energy-thresholding procedure for data reduction with multiple complex curves

Author keywords

Cluster analysis; Data mining; Data reduction; Denoising; Wavelet thresholding

Indexed keywords

DATA MINING; DECISION THEORY; FAULT TREE ANALYSIS; LEARNING SYSTEMS; STATISTICAL PROCESS CONTROL; WAVELET TRANSFORMS;

EID: 33749386445     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCB.2006.874681     Document Type: Article
Times cited : (19)

References (37)
  • 1
    • 30844467330 scopus 로고    scopus 로고
    • "Wavelet-based SPC procedure for complicated functional data"
    • Feb
    • M. K. Jeong, J. C. Lu, and N. Wang, "Wavelet-based SPC procedure for complicated functional data," Int. J. Prod. Res., vol. 44, no. 4, pp. 729-744, Feb. 2006.
    • (2006) Int. J. Prod. Res. , vol.44 , Issue.4 , pp. 729-744
    • Jeong, M.K.1    Lu, J.C.2    Wang, N.3
  • 3
    • 0032118892 scopus 로고    scopus 로고
    • "Multiscale PCA with application to multivariate statistical process monitoring"
    • Jul
    • B. R. Bakshi, "Multiscale PCA with application to multivariate statistical process monitoring," AIChe J., vol. 44, no. 7, pp. 1596-1610, Jul. 1998.
    • (1998) AIChe J. , vol.44 , Issue.7 , pp. 1596-1610
    • Bakshi, B.R.1
  • 4
    • 0033276876 scopus 로고    scopus 로고
    • "Feature-preserving data compression of stamping tonnage information using wavelets"
    • Nov
    • J. Jin and J. Shi, "Feature-preserving data compression of stamping tonnage information using wavelets," Technometrics, vol. 41, no. 4, pp. 327-339, Nov. 1999.
    • (1999) Technometrics , vol.41 , Issue.4 , pp. 327-339
    • Jin, J.1    Shi, J.2
  • 5
    • 0345327839 scopus 로고    scopus 로고
    • "Wavelet based indentification of delamination emission signal"
    • Nov
    • R. Ganesan, T. K. Das, A. K. Sikder, and A. Kumar, "Wavelet based indentification of delamination emission signal," IEEE Trans. Semicond. Manuf., vol. 16, no. 4, pp. 677-685, Nov. 2003.
    • (2003) IEEE Trans. Semicond. Manuf. , vol.16 , Issue.4 , pp. 677-685
    • Ganesan, R.1    Das, T.K.2    Sikder, A.K.3    Kumar, A.4
  • 6
    • 0036474782 scopus 로고    scopus 로고
    • "A wavelet-based procedure for process fault detection"
    • Feb
    • E. K. Lada, J. C. Lu, and J. R. Willson, "A wavelet-based procedure for process fault detection," IEEE Trans. Semicond. Manuf., vol. 15, no. 1, pp. 79-90, Feb. 2002.
    • (2002) IEEE Trans. Semicond. Manuf. , vol.15 , Issue.1 , pp. 79-90
    • Lada, E.K.1    Lu, J.C.2    Willson, J.R.3
  • 7
    • 85129253887 scopus 로고    scopus 로고
    • "On-line prediction of motor shaft misalignment using Fourier-transformed power spectrum data and support vector regression"
    • to be published
    • O. A. Omitaomua, M. K. Jeong, A. B. Badirua, and J. W. Hines, " On-line prediction of motor shaft misalignment using Fourier-transformed power spectrum data and support vector regression," ASME Trans. J. Manuf. Sci. Eng., 2006, to be published.
    • (2006) ASME Trans. J. Manuf. Sci. Eng.
    • Omitaomua, O.A.1    Jeong, M.K.2    Badirua, A.B.3    Hines, J.W.4
  • 8
    • 8344220561 scopus 로고    scopus 로고
    • "Methodology of mining massive data set for improving manufacturing quality/efficiency"
    • in ser. Massive Computing, D. Braha, Ed. New York: Kluwer
    • J. C. Lu, "Methodology of mining massive data set for improving manufacturing quality/efficiency," in Data Mining for Design and Manufacturing: Methods and Applications, ser. Massive Computing, D. Braha, Ed. New York: Kluwer, 2001, pp. 255-288.
    • (2001) Data Mining for Design and Manufacturing: Methods and Applications , pp. 255-288
    • Lu, J.C.1
  • 10
    • 0242679450 scopus 로고    scopus 로고
    • "Wavelet-based nonparametric modeling of hierarchical functions in colon carcinogenesis"
    • Sep
    • J. Morris, M. Vannucci, P. J. Brown, and R. J. Carrol, "Wavelet-based nonparametric modeling of hierarchical functions in colon carcinogenesis," J. Amer. Stat. Assoc., vol. 98, no. 463, pp. 573-597, Sep. 2003.
    • (2003) J. Amer. Stat. Assoc. , vol.98 , Issue.463 , pp. 573-597
    • Morris, J.1    Vannucci, M.2    Brown, P.J.3    Carrol, R.J.4
  • 11
    • 1542469448 scopus 로고    scopus 로고
    • "Bayesian wavelet regression on curves with application to a spectroscopic calibration problem"
    • Jun
    • P. J. Brown and M. Vannucci, "Bayesian wavelet regression on curves with application to a spectroscopic calibration problem," J. Amer. Stat. Assoc., vol. 96, no. 454, pp. 398-408, Jun. 2001.
    • (2001) J. Amer. Stat. Assoc. , vol.96 , Issue.454 , pp. 398-408
    • Brown, P.J.1    Vannucci, M.2
  • 12
    • 0032332076 scopus 로고    scopus 로고
    • "Test of significance when they are curves"
    • Sep
    • J. Fang and S. K. Lin, "Test of significance when they are curves," J. Amer. Stat. Assoc., vol. 93, no. 443, pp. 1007-1021, Sep. 1998.
    • (1998) J. Amer. Stat. Assoc. , vol.93 , Issue.443 , pp. 1007-1021
    • Fang, J.1    Lin, S.K.2
  • 13
    • 3943102115 scopus 로고    scopus 로고
    • "Wavelet-based multiscale statistical process monitoring: A literature review"
    • Sep
    • R. Ganesan, T. K. Das, and V. Venkataraman, "Wavelet-based multiscale statistical process monitoring: A literature review," IIE Trans., vol. 36, no. 9, pp. 787-806, Sep. 2004.
    • (2004) IIE Trans. , vol.36 , Issue.9 , pp. 787-806
    • Ganesan, R.1    Das, T.K.2    Venkataraman, V.3
  • 14
    • 33344471010 scopus 로고    scopus 로고
    • "Wavelet-based data reduction techniques for fault detection and classification"
    • Feb
    • M. K. Jeong, J. C. Lu, X. Huo, B. Vidakovic, and D. Chen, "Wavelet-based data reduction techniques for fault detection and classification," Technometrics, vol. 48, no. 1, pp. 26-40, Feb. 2006.
    • (2006) Technometrics , vol.48 , Issue.1 , pp. 26-40
    • Jeong, M.K.1    Lu, J.C.2    Huo, X.3    Vidakovic, B.4    Chen, D.5
  • 16
    • 0035252777 scopus 로고    scopus 로고
    • "A functional data-analytic approach to signal discrimination"
    • Feb
    • P. Hall, D. S. Poskitt, and B. Presnell, "A functional data-analytic approach to signal discrimination," Technometrics, vol. 43, no. 1, pp. 1-9, Feb. 2001.
    • (2001) Technometrics , vol.43 , Issue.1 , pp. 1-9
    • Hall, P.1    Poskitt, D.S.2    Presnell, B.3
  • 17
    • 0035359901 scopus 로고    scopus 로고
    • "Automatic feature extraction of waveform signals for in-process diagnostic performance improvement"
    • Jun
    • J. Jin and J. Shi, "Automatic feature extraction of waveform signals for in-process diagnostic performance improvement," J. Intell. Manuf., vol. 12, no. 3, pp. 257-268, Jun. 2001.
    • (2001) J. Intell. Manuf. , vol.12 , Issue.3 , pp. 257-268
    • Jin, J.1    Shi, J.2
  • 18
    • 0041958932 scopus 로고
    • "Ideal spatial adaptation by wavelet shrinkage"
    • D. L. Donoho and I. M. Johnstone, "Ideal spatial adaptation by wavelet shrinkage," Biometrika, vol. 81, no. 4, pp. 425-455, 1994.
    • (1994) Biometrika , vol.81 , Issue.4 , pp. 425-455
    • Donoho, D.L.1    Johnstone, I.M.2
  • 19
    • 84950459514 scopus 로고
    • "Adapting to unknown smoothness in wavelet shrinkage"
    • Dec
    • D. L. Donoho and I. M. Johnstone, "Adapting to unknown smoothness in wavelet shrinkage," J. Amer. Stat. Assoc., vol. 90, no. 432, pp. 1200-1224, Dec. 1995.
    • (1995) J. Amer. Stat. Assoc. , vol.90 , Issue.432 , pp. 1200-1224
    • Donoho, D.L.1    Johnstone, I.M.2
  • 21
    • 0032390647 scopus 로고    scopus 로고
    • "Semiparametric stochastic mixed models for longitudinal data"
    • Jun
    • D. Zhang, X. Lin, J. Raz, and M. Sowers, "Semiparametric stochastic mixed models for longitudinal data," J. Amer. Stat. Assoc., vol. 93, no. 442, pp. 710-719, Jun. 1998.
    • (1998) J. Amer. Stat. Assoc. , vol.93 , Issue.442 , pp. 710-719
    • Zhang, D.1    Lin, X.2    Raz, J.3    Sowers, M.4
  • 23
    • 0037189969 scopus 로고    scopus 로고
    • "Wavelet estimation of a base-line signal from repeated measurements by vertical block shrinkage"
    • Aug
    • W. Chang and B. Vidakovic, "Wavelet estimation of a base-line signal from repeated measurements by vertical block shrinkage," Comput. Stat. Data Anal., vol. 40, no. 2, pp. 317-328, Aug. 2002.
    • (2002) Comput. Stat. Data Anal. , vol.40 , Issue.2 , pp. 317-328
    • Chang, W.1    Vidakovic, B.2
  • 25
    • 0000938486 scopus 로고    scopus 로고
    • "Model selection using wavelet decomposition and applications"
    • A. Antoniadis, I. Gijbels, and G. Grégoire, "Model selection using wavelet decomposition and applications," Biometrika, vol. 84, no. 4, pp. 751-763, 1997.
    • (1997) Biometrika , vol.84 , Issue.4 , pp. 751-763
    • Antoniadis, A.1    Gijbels, I.2    Grégoire, G.3
  • 26
    • 85011629828 scopus 로고
    • "Simultaneous noise suppression and signal compression using a library of orthonormal bases and the minimum description length criterion"
    • in E. Foufoula-Georgiou and P. Kumar, Eds. New York: Academic
    • N. Saito, "Simultaneous noise suppression and signal compression using a library of orthonormal bases and the minimum description length criterion," in Wavelets in Geophysics, E. Foufoula-Georgiou and P. Kumar, Eds. New York: Academic, 1994, pp. 299-324.
    • (1994) Wavelets in Geophysics , pp. 299-324
    • Saito, N.1
  • 28
    • 0031696436 scopus 로고    scopus 로고
    • "Wavelet shrinkage and generalized cross validation for image denoising"
    • Jan
    • N. Weyrich and G. T. Warhola, "Wavelet shrinkage and generalized cross validation for image denoising," IEEE Trans. Image Process., vol. 7, no. 1, pp. 82-90, Jan. 1998.
    • (1998) IEEE Trans. Image Process. , vol.7 , Issue.1 , pp. 82-90
    • Weyrich, N.1    Warhola, G.T.2
  • 29
    • 0026203934 scopus 로고
    • "Digital signal processing techniques for high accuracy ultrasonic range measurements"
    • Aug
    • M. Parrilla, J. J. Anaya, and C. Fritsch, "Digital signal processing techniques for high accuracy ultrasonic range measurements," IEEE Trans. Instrum. Meas., vol. 40, no. 4, pp. 759-763, Aug. 1991.
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , Issue.4 , pp. 759-763
    • Parrilla, M.1    Anaya, J.J.2    Fritsch, C.3
  • 30
    • 30844446312 scopus 로고    scopus 로고
    • "Structured wavelet antenna signal modeling and random scale generalized linear model"
    • Ph.D. dissertation, Dept. Stat., North Carolina State Univ., Raleigh
    • W. Zhou, "Structured wavelet antenna signal modeling and random scale generalized linear model," Ph.D. dissertation, Dept. Stat., North Carolina State Univ., Raleigh, 1998.
    • (1998)
    • Zhou, W.1
  • 31
    • 33751094040 scopus 로고    scopus 로고
    • "Online multi-channel forging tonnage monitoring and fault pattern discrimination using principal curve"
    • to be published
    • J. Kim, Q. Huang, J. Shi, and T.-S. Chang, "Online multi-channel forging tonnage monitoring and fault pattern discrimination using principal curve," ASME Trans. J. Manuf. Sci., 2006, to be published.
    • (2006) ASME Trans. J. Manuf. Sci.
    • Kim, J.1    Huang, Q.2    Shi, J.3    Chang, T.-S.4
  • 32
    • 0001271953 scopus 로고    scopus 로고
    • "Diagnostic feature extraction from stamping tonnage signals based on design of experiment"
    • J. Jin and J. Shi, "Diagnostic feature extraction from stamping tonnage signals based on design of experiment," ASME Trans. J. Manuf. Sci. Eng., vol. 122, no. 2, pp. 360-369, 2000.
    • (2000) ASME Trans. J. Manuf. Sci. Eng. , vol.122 , Issue.2 , pp. 360-369
    • Jin, J.1    Shi, J.2
  • 33
    • 0141740573 scopus 로고    scopus 로고
    • "Tonnage signature attribute analysis for stamping process"
    • C. K. H. Koh, J. Shi, and J. Black, "Tonnage signature attribute analysis for stamping process," NAMRI/SME Trans., vol. 23, pp. 193-198, 1996.
    • (1996) NAMRI/SME Trans. , vol.23 , pp. 193-198
    • Koh, C.K.H.1    Shi, J.2    Black, J.3
  • 34
    • 0033276876 scopus 로고    scopus 로고
    • "Feature-preserving data compression of stamping tonnage information using wavelets"
    • Nov
    • J. Jin and J. Shi, "Feature-preserving data compression of stamping tonnage information using wavelets," Technometrics, vol. 41, no. 4, pp. 327-339, Nov. 1999.
    • (1999) Technometrics , vol.41 , Issue.4 , pp. 327-339
    • Jin, J.1    Shi, J.2
  • 35
    • 0142195910 scopus 로고    scopus 로고
    • "Thresholded scalogram and its application in process fault detection"
    • M. K. Jeong, D. Chen, and C. Lu, "Thresholded scalogram and its application in process fault detection," Appl. Stoch. Models Bus. Ind., vol. 19, no. 3, pp. 231-244, 2003.
    • (2003) Appl. Stoch. Models Bus. Ind. , vol.19 , Issue.3 , pp. 231-244
    • Jeong, M.K.1    Chen, D.2    Lu, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.