Wavelet shrinkage and generalized cross validation for image denoising

IEEE Transactions on Image Processing

Volumn 7, Issue 1, 1998, Pages 82-90

  Weyrich, Norman ^a   Warhola, Gregory T ^b  

^a Synopsys GmbH   (Germany)

^b ERIM International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETER ESTIMATION; VECTORS; WAVELET TRANSFORMS;

GENERALIZED CROSS VALIDATION; IMAGE DENOISING;

IMAGE RECONSTRUCTION;

EID: 0031696436     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/83.650852     Document Type: Article

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