Wavelet-based data reduction techniques for process fault detection

Technometrics

Volumn 48, Issue 1, 2006, Pages 26-40

  Jeong, Myong K ^a   Lu, Jye Chyi ^b   Huo, Xiaoming ^b   Vidakovic, Brani ^b   Chen, Di ^c  

^a University of Tennessee Knoxville   (United States)

^b Georgia Institute of Technology   (United States)

^c UCB PHARMA   (Belgium)

Author keywords

Data denoising; Data mining; Quality improvement; Scalogram; Signal processing

Indexed keywords

DATA DENOISING; QUALITY IMPROVEMENT; SCALOGRAM;

DATA MINING; DATA REDUCTION; FUNCTIONS; PARAMETER ESTIMATION; SIGNAL PROCESSING; TREES (MATHEMATICS);

WAVELET TRANSFORMS;

EID: 33344471010     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000553     Document Type: Article

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