Thresholded scalogram and its applications in process fault detection

Applied Stochastic Models in Business and Industry

Volumn 19, Issue 3, 2003, Pages 231-244

  Jeong, Myong K ^a   Chen, Di ^a   Lu, Jye Chyi ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Asymptotic normality; Classification; Data mining; Discrete wavelet transform; Pattern recognition; Scalogram; Signal processing

Indexed keywords

ASTRONOMY; ASYMPTOTIC STABILITY; CLASSIFICATION (OF INFORMATION); DATA MINING; DECISION MAKING; FAULT TOLERANT COMPUTER SYSTEMS; IMAGE PROCESSING; REGRESSION ANALYSIS; SPURIOUS SIGNAL NOISE; WAVELET TRANSFORMS;

SCALOGRAMS;

SIGNAL PROCESSING;

EID: 0142195910     PISSN: 15241904     EISSN: None     Source Type: Journal    
DOI: 10.1002/asmb.495     Document Type: Article

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