Wavelet-based SPC procedure for complicated functional data

International Journal of Production Research

Volumn 44, Issue 4, 2006, Pages 729-744

  Jeong, M K ^a   Lu, J C ^b   Wang, N ^b  

^a University of Tennessee Knoxville   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

Control chart; Data reduction; Functional data; Process control; Quality improvement; Thresholding test

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; PARAMETER ESTIMATION; QUALITY CONTROL; RELIABILITY; WAVELET TRANSFORMS;

CONTROL CHART; FUNCTIONAL DATA; THRESHOLDING TEST;

STATISTICAL PROCESS CONTROL;

EID: 30844467330     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540500222647     Document Type: Article

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