SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 106, Issue 11-12 SPEC. ISS., 2006, Pages 1069-1075

Soft-X-ray emission spectroscopy based on TEM-Toward a total electronic structure analysis

(2) Terauchi, Masami a Kawana, Masanao a

a TOHOKU UNIVERSITY (Japan)

Author keywords

Boron nitride; EELS XES analysis; Soft X ray emission spectroscopy; Wavelength dispersive spectroscopy

Indexed keywords

CUBIC BORON NITRIDE; DIELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; SPECTROSCOPIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAYS;

BAND DIAGRAM; SOFT-X-RAY EMISSION SPECTROSCOPY (SXES); XES ANALYSIS;

ELECTRONIC STRUCTURE;

ALUMINUM; BORON; COPPER;

ANISOTROPY; ARTICLE; CHEMICAL BOND; CHEMICAL STRUCTURE; DIELECTRIC CONSTANT; MATHEMATICAL ANALYSIS; ROENTGEN SPECTROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33749263864 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2006.04.021 Document Type: Article

Times cited : (33)

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