A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1044-1045

  Terauchi, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544352182     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604883880     Document Type: Conference Paper

References (4)

1. M. Terauchi et al.: J. Microscopy, 194 (1999) 203.
2. M. Terauchi et al.: J. Electron Microscopy, 50 (2001) 101.
3. M. Terauchi and M. Kawana: Microsc. Microanal., 8 suppl.2 (2002) 644.
4. M. Terauchi and M. Koike: Microsc. Microanal., 9 suppl.2 (2003) 894.