Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope

Journal of Electron Microscopy

Volumn 50, Issue 2, 2001, Pages 101-104

  Terauchi, Masami ^a   Yamamoto, Hideto ^a   Tanaka, Michiyoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

B K emission spectra; DOS of the valence band; Hexagonal boron nitride; Soft X ray spectrometer; Transmission electron microscope; X ray emission spectroscopy

Indexed keywords

ARTICLE;

ELECTRONS; EMISSION SPECTROSCOPY; NITRIDES; TRANSMISSION ELECTRON MICROSCOPY; VALENCE BANDS; X RAY SPECTROMETERS;

B K-EMISSION SPECTRUM; DOS OF THE VALENCE BAND; EMISSION SPECTRUMS; GRAZING INCIDENCE; HEXAGONAL BORON-NITRIDE; SOFT X-RAY; SOFT-X-RAY SPECTROMETER; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE; X-RAY SPECTROMETERS;

III-V SEMICONDUCTORS;

EID: 0035023310     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.2.101     Document Type: Article

References (12)

1. Development of a high energy resolution electron energy-loss spectroscopy microscope
2. High-resolution EELS study of carbon and boron allotropes
3. Electron energy-loss spectroscopy study of the electronic structure of boron nitride nanotubes
4. 15
5. 15
6. 3 (x=0.012)
7. High-resolution, energy-dispersive microcalorimeter spectrometer for X-ray microanalysis
8. Lowering the limit of detection in high special resolution electron beam microanalysis with the microcalorimeter energy dispersive X-ray spectrometer
9. Mechanically ruled aberration-corrected concave gratings for a flat-field grazing-incidence spectrograph
10. On the electronic structure of hexagonal boron nitride
11. Ab initio calculation of band structure, X-ray emission, quantum yield and electron energy-loss spectra of hexagonal boron nitride