A new high energy-resolution soft-X-ray spectrometer for a transmission electron microscope

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 894-895

  Terauchi, M ^a   Koike, M ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419638     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444474     Document Type: Conference Paper

References (3)

1. M. Terauchi, H. Yamamoto and M. Tanaka: J. Electron Microscopy, 50 (2001) 101.
2. M. Terauchi, H. Yamamoto and M. Tanaka: Microsc. Microanal., 7 suppl.2 (2001) 228.
3. M. Terauchi and M. Kawana: Microsc. Microanal., 8 suppl.2 (2002) 644.