Statistical analysis of random errors from calibration standards

IEEE MTT-S International Microwave Symposium Digest

Volumn 2005, Issue , 2005, Pages 1667-1670

  Chen, Xiaoming ^a  

^a Microelectronics Engineering   (Canada)

Author keywords

Calibration; Ceramics; Packaging; Scattering parameters; Transmission lines; Uncertainty

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; ELECTRIC LINES; MICROSTRIP ANTENNAS; SIGNAL RECEIVERS; STANDARDS; STATISTICAL METHODS;

ELECTROMAGNETIC MODELING; ERROR ESTIMATION; TRANSCEIVER MODULE TESTING; VNA CALIBRATION STANDARDS;

ERROR ANALYSIS;

EID: 33749249599     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1517032     Document Type: Conference Paper

References (12)

1. "Specifying calibration standards for the Agilent 8510 networks analyzer," Agilent product note 8510-5B.
2. "In-fixture measurements using vector network analyzer," Agilent application note.
3. "Electronic vs. mechanical calibration kits: calibration methods and accuracy," Agilent application note.
4. "Measurement uncertainties," Agilent 8510C network analyzer, on-site service manual.
5. D. F. Williams, J. C. M. Wang and U. Arz, "An optimal vector-network-analyzer calibration algorithm," IEEE Trans. Microwave Theory & Tech., vol. MTT-51, no. 12, pp.2391-2401, Dec. 2003.
6. D. C. DeGroot, Y. Rolain, R. Pintelon and J. Schoukens, "Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method.' 2004 IEEE MTT-S Int. Microwave Symp. Dig., vol. 3, pp. 1735-1738, June 2004.
7. P. T. Boggs, R. H. Byrd, J. E. Rogers and R. B. Schnabel, "User's reference guide for ODRPACK version 2.01, Software for weighted orthogonal distance regression," June 1992. Available: http://groups.yahoo.com/group/mtt-11-on-wafter/
8. D. F. Williams, C. M. Wang and U. Arz, "StatistiCAL users' manual," Available: http://www.boulder.nist.gov/dylan/
9. "National Institute of Standard and Technology De-embedding software, Program MultiCal revision 1.00, user's guide," Available: http://www.boulder.nist.gov/dylan/
10. D. K. Walker and D. F. Williams, "Compensation for geometrical variations in coplanar waveguide probe-tip calibration," IEEE Micowave Guided Wave Lett., vol. 7, no. 4, pp.97-99, April 1997.
11. G. Carchon, W. D. Raedt and E. Beyne, "Compensating differences between measurement and calibration wafter in probe-tip calibrations," 2002 IEEE MTT-S Int. Microwave Dig., vol. 3, pp. 1837-1840, 2002.
12. W. R. Eisenstadt and Y. Eo, "S-parameter-based IC interconnect transmission line characterization," IEEE Trans. Components, hybrids & Tech., vol. 15, no. 4, pp. 493-490, August 1992.