Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2004, Pages 1735-1738

  DeGroot, Donald C ^a   Rolain, Yves ^b   Pintelon, Rik ^b   Schoukens, Johan ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Calibrations; Measurements; Propagation Constant; Vector Network Analyzer

Indexed keywords

CALIBRATION; CODES (STANDARDS); ELECTRIC LINES; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC WAVE PROPAGATION; RANDOM PROCESSES; SCATTERING PARAMETERS;

GENERIC TRANSMISSION LINES; PROPAGATION CONSTANT; TRANSMISSION LINE STANDARDS; VECTOR NETWORK ANALYZERS (VNA);

MICROWAVE CIRCUITS;

EID: 4544349745     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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