Electrical and topological characterization of interconnect open defects

Proceedings - 2005 IEEE International Workshop on Current and Defect Based Testing, DBT 2005

Volumn , Issue , 2005, Pages 42-46

  Rodriguez Montanes, Rosa ^a   Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTRIC POWER SYSTEM INTERCONNECTION; ELECTRIC PROPERTIES; ERROR ANALYSIS; PHASE SHIFT; TIME DOMAIN ANALYSIS; TOPOLOGY;

ELECTRICAL PARAMETERS; PROCESS PARAMETER VARIATIONS; PROPAGATION CONSTANT; TOPOLOGICAL PARAMETERS;

DEFECTS;

EID: 33749060217     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DBT.2005.1531300     Document Type: Conference Paper

References (8)

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3. J. C. M. Li, C-W Tseng and E. J. McCluskey, "Testing for Resistive Opens and Stuck Opens", in Proc. Int'l Test Conf., pp. 1049-1058, 2001.
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8. R. E. Matick, "Transmission Lines for Digital and Communication Networks", McGraw-Hill, 1969.